Imec looks at variability issue beyond 10 nm

Imec looks at variability issue beyond 10 nm

PARIS – CMOS technology scaling will go on for the foreseeable future but, as we enter the 10nm node, process complexity reduction and variability control will become crucial and drive technology decisions, said An Steegen, senior vice president process technology at Imec, at the annual Imec Technology Forum last week at the Square meeting center in Brussels, Belgium.



Previous
Next    Kathryn Kranen elected chair of EDA Consortium