Microsemi completes impressive FPGA reliability testing

Microsemi completes impressive FPGA reliability testing

MANHASSET, NY -- Microsemi has announced that an independent organization has tested its commercial-grade FPGAs for more than four years with an accumulated total of more than 26 million device-hours without a single anti-fuse failure.

Microsemi's commercial-grade Axcelerator FPGAs are the commercial equivalent of Microsemi's space-flight RTAX-S/SL FPGAs and share the same CMOS structures, antifuse technology, materials, processing, dimensions and programming attributes, according to Microsemi.

The RTAX-S/SL FPGAs are also radiation-tolerant and include flip-flops protected against radiation-induced upsets by built-in triple-module redundancy.

"The rigorous independent high-performance tests and unprecedented amount of associated reliability data prove that our Axcelerator FPGAs are extremely reliable," said Paul Ekas, vice president of Marketing for SoC products at Microsemi, in a statement.
 
The testing process involved programming parts with a stringent design featuring excellent observability of failure mechanisms prior to the start of the tests. In addition, the tests included a combination of high temperature operating life (HTOL), low temperature operating life (LTOL) and temperature cycle tests.

Microsemi said its RTAX-S/SL radiation-tolerant FPGAs are specifically designed for space applications and are offered in densities of up to 4 million equivalent system gates and 840 user I/Os.

The company recently introduced the first in a new family of octal source driver ICs for aerospace and other high-reliability power electronics control applications including motor control. The new driver can be used in conjunction with Microsemi's radiation-hardened and -tolerant programmable logic products and diodes to easily implement redundant power management solutions.

Microsemi next invitation-only, one-day Space Forum will take place Dec. 4, 2012 in Los Angeles.


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