1 pcs
Mininum order quantity from 1PCS SN74ABT8652DWR
Mininum order value from 1USD
2 days
lead time of SN74ABT8652DWR is from 2 to 5 days
12 hours
Fast quotation of SN74ABT8652DWR within 12 hours
60 days
60 days full quality warranty of SN74ABT8652DWR
1, we will give you new and original parts with factory sealed package
2, Quality warranted: All products have to be passed our Quality Control before delivery.
2,If you need more details of SN74ABT8652DWR,like pictures ,package,datasheet and so on, pls email to [email protected]
The ’LV4040A devices are 12-bit asynchronous binary counters with the outputs of all stages available externally. A high level at the clear (CLR) input asynchronously clears the counter and resets all outputs low. SN74ABT8652DWR Texas Instruments(TI) IC SCAN TEST DEVICE 28-SOIC The count is advanced on a high-to-low transition at the clock (CLK) input. Applications include time-delay circuits, counter controls, and frequency-dividing circuits. These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. SN74ABT8652DWR Texas Instruments(TI) IC SCAN TEST DEVICE 28-SOIC
· Available in Texas Instruments NanoStar™ · ±24-mA Output Drive at 3.3 V and NanoFree™ Packages · Ioff Supports Partial-Power-Down ModeSN74ABT8652DWR Texas Instruments(TI) IC SCAN TEST DEVICE 28-SOIC
· Supports 5-V VCC Operation Operation SN74ABT8652DWR Texas Instruments(TI) IC SCAN TEST DEVICE 28-SOIC
· Inputs Accept Voltages to 5.5 V · Latch-Up Performance Exceeds 100 mA Per
· One Unbuffered Inverter (SN74LVC1GU04) JESD 78, Class II and One Buffered Inverter (SN74LVC1G04) · ESD Protection Exceeds JESD 22 SN74ABT8652DWR Texas Instruments(TI) IC SCAN TEST DEVICE 28-SOIC
· Suitable for Commonly Used Clock – 2000-V Human-Body Model (A114-A) Frequencies: – 200-V Machine Model (A115-A)15 kHz, 3.58 MHz, 4.43 MHz, 13 MHz, – 1000-V Charged-Device Model (C101) 25 MHz, 26 MHz, 27 MHz, 28 MHz
· Max tpd of 2.4 ns at 3.3 V SN74ABT8652DWR Texas Instruments(TI) IC SCAN TEST DEVICE 28-SOIC
· Low Power Consumption, 10-mA Max ICC