1 pcs
Mininum order quantity from 1PCS SN74BCT8240ANTE4
Mininum order value from 1USD
2 days
lead time of SN74BCT8240ANTE4 is from 2 to 5 days
12 hours
Fast quotation of SN74BCT8240ANTE4 within 12 hours
60 days
60 days full quality warranty of SN74BCT8240ANTE4
1, we will give you new and original parts with factory sealed package
2, Quality warranted: All products have to be passed our Quality Control before delivery.
2,If you need more details of SN74BCT8240ANTE4,like pictures ,package,datasheet and so on, pls email to [email protected]
The ’LV4040A devices are 12-bit asynchronous binary counters with the outputs of all stages available externally. A high level at the clear (CLR) input asynchronously clears the counter and resets all outputs low. SN74BCT8240ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-DIP The count is advanced on a high-to-low transition at the clock (CLK) input. Applications include time-delay circuits, counter controls, and frequency-dividing circuits. These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. SN74BCT8240ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-DIP
· Available in Texas Instruments NanoStar™ · ±24-mA Output Drive at 3.3 V and NanoFree™ Packages · Ioff Supports Partial-Power-Down ModeSN74BCT8240ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-DIP
· Supports 5-V VCC Operation Operation SN74BCT8240ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-DIP
· Inputs Accept Voltages to 5.5 V · Latch-Up Performance Exceeds 100 mA Per
· One Unbuffered Inverter (SN74LVC1GU04) JESD 78, Class II and One Buffered Inverter (SN74LVC1G04) · ESD Protection Exceeds JESD 22 SN74BCT8240ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-DIP
· Suitable for Commonly Used Clock – 2000-V Human-Body Model (A114-A) Frequencies: – 200-V Machine Model (A115-A)15 kHz, 3.58 MHz, 4.43 MHz, 13 MHz, – 1000-V Charged-Device Model (C101) 25 MHz, 26 MHz, 27 MHz, 28 MHz
· Max tpd of 2.4 ns at 3.3 V SN74BCT8240ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-DIP
· Low Power Consumption, 10-mA Max ICC