SN74BCT8240ADW Supplier,Distributor,Price,Datasheet,PDF

SN74BCT8240ADW distributor(IC SCAN TEST DEVICE BUFF 24-SOIC),SN74BCT8240ADW short lead time

Part Number:   SN74BCT8240ADW
Description:   IC SCAN TEST DEVICE BUFF 24-SOIC
Category:   TI distributor
Manufacture:   Texas Instruments(TI)
Package:   IC SCAN TEST DEVICE BUFF 24-SOIC
Standard Package:   
   Send RFQ for SN74BCT8240ADW 
1 pcs
Mininum order quantity from 1PCS SN74BCT8240ADW
Mininum order value from 1USD
2 days
lead time of SN74BCT8240ADW is from 2 to 5 days
12 hours
Fast quotation of SN74BCT8240ADW within 12 hours
60 days
60 days full quality warranty of SN74BCT8240ADW
 
1, we will give you new and original parts with factory sealed package
2, Quality warranted: All products have to be passed our Quality Control before delivery.
2,If you need more details of SN74BCT8240ADW,like pictures ,package,datasheet and so on, pls email to [email protected]
The ’LV4040A devices are 12-bit asynchronous binary counters with the outputs of all stages available externally. A high level at the clear (CLR) input asynchronously clears the counter and resets all outputs low. SN74BCT8240ADW Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-SOIC The count is advanced on a high-to-low transition at the clock (CLK) input. Applications include time-delay circuits, counter controls, and frequency-dividing circuits. These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. SN74BCT8240ADW Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-SOIC
· Available in Texas Instruments NanoStar™ · ±24-mA Output Drive at 3.3 V and NanoFree™ Packages · Ioff Supports Partial-Power-Down ModeSN74BCT8240ADW Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-SOIC
· Supports 5-V VCC Operation Operation SN74BCT8240ADW Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-SOIC
· Inputs Accept Voltages to 5.5 V · Latch-Up Performance Exceeds 100 mA Per
· One Unbuffered Inverter (SN74LVC1GU04) JESD 78, Class II and One Buffered Inverter (SN74LVC1G04) · ESD Protection Exceeds JESD 22 SN74BCT8240ADW Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-SOIC
· Suitable for Commonly Used Clock – 2000-V Human-Body Model (A114-A) Frequencies: – 200-V Machine Model (A115-A)15 kHz, 3.58 MHz, 4.43 MHz, 13 MHz, – 1000-V Charged-Device Model (C101) 25 MHz, 26 MHz, 27 MHz, 28 MHz
· Max tpd of 2.4 ns at 3.3 V SN74BCT8240ADW Texas Instruments(TI) IC SCAN TEST DEVICE BUFF 24-SOIC
· Low Power Consumption, 10-mA Max ICC