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The ’LV4040A devices are 12-bit asynchronous binary counters with the outputs of all stages available externally. A high level at the clear (CLR) input asynchronously clears the counter and resets all outputs low. SN74BCT8373ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE LATCH 24-DIP The count is advanced on a high-to-low transition at the clock (CLK) input. Applications include time-delay circuits, counter controls, and frequency-dividing circuits. These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. SN74BCT8373ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE LATCH 24-DIP
· Available in Texas Instruments NanoStar™ · ±24-mA Output Drive at 3.3 V and NanoFree™ Packages · Ioff Supports Partial-Power-Down ModeSN74BCT8373ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE LATCH 24-DIP
· Supports 5-V VCC Operation Operation SN74BCT8373ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE LATCH 24-DIP
· Inputs Accept Voltages to 5.5 V · Latch-Up Performance Exceeds 100 mA Per
· One Unbuffered Inverter (SN74LVC1GU04) JESD 78, Class II and One Buffered Inverter (SN74LVC1G04) · ESD Protection Exceeds JESD 22 SN74BCT8373ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE LATCH 24-DIP
· Suitable for Commonly Used Clock – 2000-V Human-Body Model (A114-A) Frequencies: – 200-V Machine Model (A115-A)15 kHz, 3.58 MHz, 4.43 MHz, 13 MHz, – 1000-V Charged-Device Model (C101) 25 MHz, 26 MHz, 27 MHz, 28 MHz
· Max tpd of 2.4 ns at 3.3 V SN74BCT8373ANTE4 Texas Instruments(TI) IC SCAN TEST DEVICE LATCH 24-DIP
· Low Power Consumption, 10-mA Max ICC