74ABTH182502APMG4 Supplier,Distributor,Price,Datasheet,PDF

74ABTH182502APMG4 distributor(IC SCAN TEST UNIV TXRX 64LQFP),74ABTH182502APMG4 short lead time

Part Number:   74ABTH182502APMG4
Description:   IC SCAN TEST UNIV TXRX 64LQFP
Category:   TI distributor
Manufacture:   Texas Instruments(TI)
Package:   IC SCAN TEST UNIV TXRX 64LQFP
Standard Package:   
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74ABTH182502APMG4 Distributor,Datasheet,PDF,Suppliers,Price


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1 pcs
Mininum order quantity from 1PCS 74ABTH182502APMG4
Mininum order value from 1USD
2 days
lead time of 74ABTH182502APMG4 is from 2 to 5 days
12 hours
Fast quotation of 74ABTH182502APMG4 within 12 hours
60 days
60 days full quality warranty of 74ABTH182502APMG4
 
1, we will give you new and original parts with factory sealed package
2, Quality warranted: All products have to be passed our Quality Control before delivery.
2,If you need more details of 74ABTH182502APMG4,like pictures ,package,datasheet and so on, pls email to [email protected]
The ’LV4040A devices are 12-bit asynchronous binary counters with the outputs of all stages available externally. A high level at the clear (CLR) input asynchronously clears the counter and resets all outputs low. 74ABTH182502APMG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64LQFP The count is advanced on a high-to-low transition at the clock (CLK) input. Applications include time-delay circuits, counter controls, and frequency-dividing circuits. These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. 74ABTH182502APMG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64LQFP
· Available in Texas Instruments NanoStar™ · ±24-mA Output Drive at 3.3 V and NanoFree™ Packages · Ioff Supports Partial-Power-Down Mode74ABTH182502APMG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64LQFP
· Supports 5-V VCC Operation Operation 74ABTH182502APMG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64LQFP
· Inputs Accept Voltages to 5.5 V · Latch-Up Performance Exceeds 100 mA Per
· One Unbuffered Inverter (SN74LVC1GU04) JESD 78, Class II and One Buffered Inverter (SN74LVC1G04) · ESD Protection Exceeds JESD 22 74ABTH182502APMG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64LQFP
· Suitable for Commonly Used Clock – 2000-V Human-Body Model (A114-A) Frequencies: – 200-V Machine Model (A115-A)15 kHz, 3.58 MHz, 4.43 MHz, 13 MHz, – 1000-V Charged-Device Model (C101) 25 MHz, 26 MHz, 27 MHz, 28 MHz
· Max tpd of 2.4 ns at 3.3 V 74ABTH182502APMG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64LQFP
· Low Power Consumption, 10-mA Max ICC