74LVTH18512DGGRG4 Supplier,Distributor,Price,Datasheet,PDF

74LVTH18512DGGRG4 distributor(IC SCAN TEST UNIV TXRX 64TSSOP),74LVTH18512DGGRG4 short lead time

Part Number:   74LVTH18512DGGRG4
Description:   IC SCAN TEST UNIV TXRX 64TSSOP
Category:   TI distributor
Manufacture:   Texas Instruments(TI)
Package:   IC SCAN TEST UNIV TXRX 64TSSOP
Standard Package:   
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74LVTH18512DGGRG4 Distributor,Datasheet,PDF,Suppliers,Price


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1 pcs
Mininum order quantity from 1PCS 74LVTH18512DGGRG4
Mininum order value from 1USD
2 days
lead time of 74LVTH18512DGGRG4 is from 2 to 5 days
12 hours
Fast quotation of 74LVTH18512DGGRG4 within 12 hours
60 days
60 days full quality warranty of 74LVTH18512DGGRG4
 
1, we will give you new and original parts with factory sealed package
2, Quality warranted: All products have to be passed our Quality Control before delivery.
2,If you need more details of 74LVTH18512DGGRG4,like pictures ,package,datasheet and so on, pls email to [email protected]
The ’LV4040A devices are 12-bit asynchronous binary counters with the outputs of all stages available externally. A high level at the clear (CLR) input asynchronously clears the counter and resets all outputs low. 74LVTH18512DGGRG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64TSSOP The count is advanced on a high-to-low transition at the clock (CLK) input. Applications include time-delay circuits, counter controls, and frequency-dividing circuits. These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. 74LVTH18512DGGRG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64TSSOP
· Available in Texas Instruments NanoStar™ · ±24-mA Output Drive at 3.3 V and NanoFree™ Packages · Ioff Supports Partial-Power-Down Mode74LVTH18512DGGRG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64TSSOP
· Supports 5-V VCC Operation Operation 74LVTH18512DGGRG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64TSSOP
· Inputs Accept Voltages to 5.5 V · Latch-Up Performance Exceeds 100 mA Per
· One Unbuffered Inverter (SN74LVC1GU04) JESD 78, Class II and One Buffered Inverter (SN74LVC1G04) · ESD Protection Exceeds JESD 22 74LVTH18512DGGRG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64TSSOP
· Suitable for Commonly Used Clock – 2000-V Human-Body Model (A114-A) Frequencies: – 200-V Machine Model (A115-A)15 kHz, 3.58 MHz, 4.43 MHz, 13 MHz, – 1000-V Charged-Device Model (C101) 25 MHz, 26 MHz, 27 MHz, 28 MHz
· Max tpd of 2.4 ns at 3.3 V 74LVTH18512DGGRG4 Texas Instruments(TI) IC SCAN TEST UNIV TXRX 64TSSOP
· Low Power Consumption, 10-mA Max ICC